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1

Red wine aging in oak barrels: evolution of the monosaccharides content

Marı́a del Alamo, Jose Luis Bernal, Ma Jesús del Nozal, Carmen Gómez-Cordovés

Journal:

Year:

2000

Language:

english

File:

PDF, 154 KB

english, 2000

2

Optimized Toroidal Inductors Versus Planar Spiral Inductors in Multilayered Technologies

Lopez-Villegas, J. M., Vidal, N., del Alamo, Jesus A.

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2017

Language:

english

File:

PDF, 2.35 MB

english, 2017

3

In Situ Thermal Atomic Layer Etching for Sub-5 nm InGaAs Multigate MOSFETs

Lu, Wenjie, Lee, Younghee, Gertsch, Jonas C., Murdzek, Jessica A., Cavanagh, Andrew S., Kong, Lisa, del Alamo, Jesús A., George, Steven M.

Journal:

Year:

2019

Language:

english

File:

PDF, 5.89 MB

english, 2019

4

Stability and Reliability of Lateral GaN Power Field-Effect Transistors

del Alamo, Jesus A., Lee, Ethan S.

Journal:

IEEE Transactions on Electron Devices

Year:

2019

Language:

english

File:

PDF, 1.26 MB

english, 2019

5

Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions

Takayuki Hisaka, Hajime Sasaki, Yoichi Nogami, Kenji Hosogi, Naohito Yoshida, A.A. Villanueva, Jesus A. del Alamo, Shigehiko Hasegawa, Hajime Asahi

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 489 KB

english, 2009

6

High voltage degradation of GaN High Electron Mobility Transistors on silicon substrate

Sefa Demirtas, Jungwoo Joh, Jesús A. del Alamo

Journal:

Microelectronics Reliability

Year:

2010

Language:

english

File:

PDF, 714 KB

english, 2010

7

Role of stress voltage on structural degradation of GaN high-electron-mobility transistors

Jungwoo Joh, Jesús A. del Alamo, Kurt Langworthy, Sujing Xie, Tsvetanka Zheleva

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 1.23 MB

english, 2011

8

Traps and defects in pre- and post- stressed AlGaN–GaN high electron mobility transistors

Yongkun Sin, Brendan Foran, Jungwoo Joh, Jesus A. del Alamo

Journal:

physica status solidi (a)

Year:

2011

Language:

english

File:

PDF, 297 KB

english, 2011

9

Modelling of minority-carrier transport in heavily doped silicon emitters

Jesús A. del Alamo, Richard M. Swanson

Journal:

Solid-State Electronics

Year:

1987

Language:

english

File:

PDF, 1.12 MB

english, 1987

10

A model for the critical voltage for electrical degradation of GaN high electron mobility transistors

Jungwoo Joh, Feng Gao, Tomás Palacios, Jesús A. del Alamo

Journal:

Microelectronics Reliability

Year:

2010

Language:

english

File:

PDF, 762 KB

english, 2010

11

Impact of gate placement on RF power degradation in GaN high electron mobility transistors

Jungwoo Joh, Jesús A. del Alamo

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 1.71 MB

english, 2012

12

THE PERILS OF EXCELLENCE: BARRIERS TO EFFECTIVE PROCESS IMPROVEMENT IN PRODUCT-DRIVEN FIRMS

REBECCA HENDERSON, JESUS DEL ALAMO, TODD BECKER, JAMES LAWTON, PETER MORAN, SAUL SHAPIRO

Journal:

Production and Operations Management

Year:

1998

Language:

english

File:

PDF, 447 KB

english, 1998

13

Impact of high-power stress on dynamic ON-resistance of high-voltage GaN HEMTs

Donghyun Jin, Jesús A. del Alamo

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 804 KB

english, 2012

14

[IEEE 2012 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Bruges, Belgium (2012.06.3-2012.06.7)] 2012 24th International Symposium on Power Semiconductor Devices and ICs - Mechanisms responsible for dynamic ON-resistance in GaN high-voltage HEMTs

Jin, Donghyun, del Alamo, Jesus A.

Year:

2012

Language:

english

File:

PDF, 910 KB

english, 2012

15

Design and modeling of Faraday cages for substrate noise isolation

Wu, Joyce H., del Alamo, Jesús A.

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 1.16 MB

english, 2013

16

[IEEE 2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop] - Monterey, CA, USA (2008.10.12-2008.10.12)] 2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop] - Degradation mechanisms of GaAs PHEMTs under operation in high humidity conditions

Hisaka, Takayuki, Sasaki, Hajime, Nogamni, Yoichi, Hosogi, Kenji, Yoshida, Naohito, Villanueva, A., del Alamo, Jesus, Hasegawa, Shigehiko, Asahi, Hajime

Year:

2008

Language:

english

File:

PDF, 5.11 MB

english, 2008

17

Activation energy of drain-current degradation in GaN HEMTs under high-power DC stress

Wu, Yufei, Chen, Chia-Yu, del Alamo, Jesús A.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 847 KB

english, 2014

18

1D-to-2D tunneling in electron waveguides

Eugster, Cristopher C., del Alamo, Jesús A., Melloch, Michael R., Rooks, Michael J.

Journal:

Physical Review B

Year:

1993

Language:

english

File:

PDF, 1.19 MB

english, 1993

19

Effects of single scatterers on transport and tunneling in a dual-electron-waveguide device

Eugster, Cristopher C., del Alamo, Jesús A., Melloch, Michael R., Rooks, Michael J.

Journal:

Physical Review B

Year:

1992

Language:

english

File:

PDF, 956 KB

english, 1992

20

Degradation Mechanism of AlGaAs/InGaAs Power Pseudomorphic High-Electron-Mobility Transistors under Large-Signal Operation

Hisaka, Takayuki, Nogami, Yoichi, Sasaki, Hajime, Yoshida, Naohito, Hayashi, Kazuo, Villanueva, Anita A., del Alamo, Jesus A.

Journal:

Japanese Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 243 KB

english, 2008

21

III–V compound semiconductor transistors—from planar to nanowire structures

Riel, Heike, Wernersson, Lars-Erik, Hong, Minghwei, del Alamo, Jesús A.

Journal:

Year:

2014

Language:

english

File:

PDF, 1.11 MB

english, 2014

22

Minority Carrier Transport in Heavily Doped Silicon: Fundamental Equations

Alamo, Jesús A. del, Swanson, Richard M.

Journal:

Japanese Journal of Applied Physics

Year:

1987

Language:

english

File:

PDF, 245 KB

english, 1987

23

Ratiometric Oxygen Imaging to Predict Oxygen Diffusivity in Oak Wood During Red Wine Barrel Aging

Nevares, Ignacio, Mayr, Torsten, Baro, Jesus Angel, Ehgartner, Josef, Crespo, Raul, del Alamo-Sanza, María

Journal:

Food and Bioprocess Technology

Year:

2016

Language:

english

File:

PDF, 2.61 MB

english, 2016

24

[IEEE 2015 IEEE International Electron Devices Meeting (IEDM) - Washington, DC (2015.12.7-2015.12.9)] 2015 IEEE International Electron Devices Meeting (IEDM) - An InGaSb p-channel FinFET

Lu, Wenjie, Kim, Jin K., Klem, John F., Hawkins, Samuel D., del Alamo, Jesus A.

Year:

2015

Language:

english

File:

PDF, 2.30 MB

english, 2015

25

Sub-10-nm Fin-Width Self-Aligned InGaAs FinFETs

Vardi, Alon, del Alamo, Jesus A.

Journal:

IEEE Electron Device Letters

Year:

2016

Language:

english

File:

PDF, 864 KB

english, 2016

26

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Negative-bias temperature instability of GaN MOSFETs

Guo, Alex, del Alamo, Jesus A.

Year:

2016

Language:

english

File:

PDF, 985 KB

english, 2016

27

A Diamond:H/WO3 Metal-Oxide-Semiconductor Field-Effect Transistor

Yin, Zongyou, Tordjman, Moshe, Vardi, Alon, Kalish, Rafi, del Alamo, Jesus A.

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 607 KB

english, 2018

28

Excess Off-State Current in InGaAs FinFETs

Zhao, Xin, Vardi, Alon, del Alamo, Jesus A.

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 896 KB

english, 2018

29

Evaluation and Reliability Assessment of GaN-on-Si MIS-HEMT for Power Switching Applications

Chou, Po-Chien, Chen, Szu-Hao, Hsieh, Ting-En, Cheng, Stone, del Alamo, Jesús, Chang, Edward

Journal:

Year:

2017

Language:

english

File:

PDF, 2.87 MB

english, 2017

30

[IEEE 2019 Symposium on VLSI Technology - Kyoto, Japan (2019.6.9-2019.6.14)] 2019 Symposium on VLSI Technology - Reassessing InGaAs for Logic: Mobility Extraction in sub-10nm Fin-Width FinFETs

Cai, Xiaowei, Vardi, Alan, Grajal, Jesus, del Alamo, Jesus A.

Year:

2019

Language:

english

File:

PDF, 456 KB

english, 2019

31

Orientation dependence of mismatched InxAl1−xAs/In0.53Ga0.47As HFETs

Sandeep R. Bahl, Walid J. Azzam, Jesús A. del Alamo

Journal:

Journal of Crystal Growth

Year:

1991

Language:

english

File:

PDF, 395 KB

english, 1991

32

Photovoltaic measurement of bandgap narrowing in moderately doped silicon

Jesus A. del Alamo, Richard M. Swanson, Arto Lietoila

Journal:

Solid-State Electronics

Year:

1983

Language:

english

File:

PDF, 576 KB

english, 1983

33

AuGeNi ohmic contacts to n-InP for FET applications

Jesús A. Del Alamo, Takashi Mizutani

Journal:

Solid-State Electronics

Year:

1988

Language:

english

File:

PDF, 498 KB

english, 1988

34

The impact of electron transport regimes on the linearity of AlGaAs/n+-InGaAs HFETs

David R. Greenberg, Jesús A. Del Alamo

Journal:

Solid-State Electronics

Year:

1993

Language:

english

File:

PDF, 699 KB

english, 1993

35

Growth of InP high electron mobility transistor structures with Te doping

Brian R. Bennett, Tetsuya Suemitsu, Niamh Waldron, Jesús A. del Alamo

Journal:

Journal of Crystal Growth

Year:

2005

Language:

english

File:

PDF, 234 KB

english, 2005

36

Quantum-corrected Monte Carlo analysis of scaling behavior of nano-scale InGaAs high electron mobility transistors

Hiroki I. Fujishiro, Takahiro Kawabata, Jesús A. del Alamo

Journal:

physica status solidi (c)

Year:

2008

Language:

english

File:

PDF, 382 KB

english, 2008

37

Inquiry-Learning with WebLab: Undergraduate Attitudes and Experiences

Judith Fischer, Rudolph Mitchell, Jesus del Alamo

Journal:

Journal of Science Education and Technology

Year:

2007

Language:

english

File:

PDF, 374 KB

english, 2007

38

Orthorhombic distortion of mismatched InXGa1−XAs/InP heterostructures

Brian R. Bennett, Jesús A. Del Alamo

Journal:

Journal of Electronic Materials

Year:

1991

Language:

english

File:

PDF, 466 KB

english, 1991

39

Patient preferences and treatment safety for uncomplicated vulvovaginal candidiasis in primary health care

Isabel Del-Cura González, Francisca García-de-Blas González, Teresa Sanz Cuesta, Jesús Martín Fernández, Justo M Del-Alamo Rodríguez, Rosa A Escriva Ferrairo, M del Canto De-Hoyos Alonso, Laura Balsal

Journal:

BMC Public Health

Year:

2011

Language:

english

File:

PDF, 226 KB

english, 2011

40

Prevención de acontecimientos adversos mediante ajuste posológico renal en pacientes ancianos institucionalizados

Celia Abajo del Álamo, Sonsoles García Rodicio, Jesús Casado Pérez, María Lourdes Ausín Pérez, Miguel A. Catalá Pindado

Journal:

Revista Española de Geriatría y Gerontología

Year:

2009

File:

PDF, 167 KB

2009

41

Respuesta de los autores

Celia Abajo del Álamo, Sonsoles García Rodicio, Miguel Ángel Catalá Pindado, M. Lourdes Ausín Pérez, Jesús Casado Pérez

Journal:

Revista Española de Geriatría y Gerontología

Year:

2010

File:

PDF, 46 KB

2010

42

Nanometre-scale electronics with III–V compound semiconductors

del Alamo, Jesús A.

Journal:

Year:

2011

Language:

english

File:

PDF, 745 KB

english, 2011

43

Strain and Temperature Dependence of Defect Formation at AlGaN/GaN High-Electron-Mobility Transistors on a Nanometer Scale

Lin, Chung-Han, Merz, Tyler A., Doutt, Daniel R., Joh, Jungwoo, del Alamo, Jesús A., Mishra, Umesh K., Brillson, Leonard J.

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 1.43 MB

english, 2012

44

[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Logic Performance of 40 nm InAs HEMTs

Kim, Dae-Hyun, del Alamo, Jesus A.

Year:

2007

Language:

english

File:

PDF, 3.69 MB

english, 2007

45

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Scaling Behavior of In0.7Ga0.3As HEMTs for Logic

Kim, Dae-Hyun, del Alamo, Jesus A.

Year:

2006

Language:

english

File:

PDF, 862 KB

english, 2006

46

High-Speed E-Mode InAs QW MOSFETs With $\hbox{Al}_{2} \hbox{O}_{3}$ Insulator for Future RF Applications

Kim, Dae-Hyun, Kim, Tae-Woo, Hill, Richard J. W., Young, Chadwin D., Kang, Chang Yong, Hobbs, Chris, Kirsch, Paul, del Alamo, Jesus A., Jammy, Raj

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 473 KB

english, 2013

47

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - 50-nm E-mode In0.7Ga0.3As PHEMTs on 100-mm InP substrate with fmax > 1 THz

Kim, Dae-Hyun, del Alamo, Jesus A., Chen, Peter, Wonill Ha,, Urteaga, Miguel, Brar, Berinder

Year:

2010

Language:

english

File:

PDF, 417 KB

english, 2010

48

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Mechanisms for Electrical Degradation of GaN High-Electron Mobility Transistors

Joh, Jungwoo, del Alamo, Jesus A.

Year:

2006

Language:

english

File:

PDF, 359 KB

english, 2006

49

[IEEE 2010 22nd International Conference on Indium Phosphide and Related Materials (IPRM) - Takamatsu, Japan (2010.05.31-2010.06.4)] 2010 22nd International Conference on Indium Phosphide and Related Materials (IPRM) - Logic characteristics of 40 nm thin-channel InAs HEMTs

Kim, Tae-Woo, Kim, Dae-Hyun, del Alamo, Jesus A.

Year:

2010

Language:

english

File:

PDF, 137 KB

english, 2010

50

A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

Lu, Wenjie, Guo, Alex, Vardi, Alon, del Alamo, Jesus A.

Journal:

IEEE Electron Device Letters

Year:

2014

Language:

english

File:

PDF, 800 KB

english, 2014

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